Publication
Feb 2009
This publication examines the tensions created by the overlap between patents and technical standards in the field of intellectual property rights, and the possible impact on international trade. After clarifying the difference between patents and standards and their objectives, the author addresses the 'open versus closed' debate on technical standards. The publication then discusses international standard-setting and manufacturing practice before using China as an illustration of the concerns over patents, standards and trade.
Download |
English (PDF, 12 pages, 2.0 MB) |
---|---|
Author | David Vivas-Eugui, Pedro Roffe |
Series | ICTSD Publications |
Issue | 3 |
Publisher | International Centre for Trade and Sustainable Development (ICTSD) |
Copyright | © 2009 International Centre for Trade and Sustainable Development (ICTSD) |